2019-20 Spring - CHMS5130 - Materials Analysis

Course

Description

Electron Microscopies: TEM; Electron diffraction; SEM; STEM; STM; AFM. Nano-materials characterization. Thin film characterization. X-ray diffraction; powder XRD; Single crystal structure determination; SAXS.
Course period1/02/20 → 30/06/20
Course levelPG
Course formatLecture