Skip to main navigation Skip to search Skip to main content

Dual beam-shear DIC system for in situ topographic measurement of phase-changing materials

Project: Research

Project Details

Chinese Project Title

實時微觀拓撲結構的雙位微分相干差光學系統的研發
StatusFinished
Effective start/end date1/01/1930/06/22

Fingerprint

Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.