2.3 A 4.2µs-settling-time 3rd-order 2.1GHz phase-noise-rejection PLL using a cascaded time-amplified clock-skew sub-sampling DLL

Zhiqiang Huang, Bingwei Jiang, Lianming Li, Howard Cam Luong

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

Abstract

Ring-VCO-based PLLs are popular because of their compact chip area and wide tuning range compared with LC-VCO-based PLLs. However, they typically have higher jitter and larger frequency drift due to high sensitivity to PVT variations. Several PLL architectures were proposed to reject the phase noise and reduce the frequency drift [1,2]. However, due to an architecture-level limitation, these phase-noise-rejection PLLs inevitably degrade the settling time. To suppress large phase noise (PN) and supply sensitivity, a Type-III PLL was proposed to provide a large low-frequency loop gain by using a 3rd-order feedback loop [1]. However, high-order feedback loop degrades stability and requires low-frequency compensation zero, which needs a large loop filter and reduces the PN suppression bandwidth. To suppress the phase noise over a wide frequency offset, injection-locked (IL) PLL was proposed by injecting a clean reference into a noisy VCO [2]. But a sub-harmonic injection into a ring-VCO requires a pulse generator, which enhances harmonics but generates large reference spurs. Besides, a race condition between the injection-locking path and the PLL path weakens the locking strength and prolongs settling time by 5 times [2]. In order to reject the phase noise and to minimize supply sensitivity and frequency drift of ring-VCO-based PLLs without compromising other parameters, this paper proposes a 3rd-order PLL employing a cascaded time-amplified clock-skew-sub-sampling DLL, measuring a 4.2μs settling time, 1.05ps integrated jitter, and -113dBc/Hz in-band phase noise with a 3.84mW power consumption at a 2.1GHz output frequency.

Original languageEnglish
Title of host publication2016 IEEE International Solid-State Circuits Conference, ISSCC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages40-41
Number of pages2
ISBN (Electronic)9781467394666
DOIs
Publication statusPublished - 23 Feb 2016
Event63rd IEEE International Solid-State Circuits Conference, ISSCC 2016 - San Francisco, United States
Duration: 31 Jan 20164 Feb 2016

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume59
ISSN (Print)0193-6530

Conference

Conference63rd IEEE International Solid-State Circuits Conference, ISSCC 2016
Country/TerritoryUnited States
CitySan Francisco
Period31/01/164/02/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

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