TY - JOUR
T1 - A Capacitor-Free CMOS Low-Dropout Regulator With Damping-Factor-Control Frequency Compensation
AU - Leung, Ka Nang
AU - Mok, Philip K.T.
PY - 2003/10
Y1 - 2003/10
N2 - A 1.5-V 100-mA capacitor-free CMOS low-dropout regulator (LDO) for system-on-chip applications to reduce board space and external pins is presented. By utilizing damping-factor-control frequency compensation on the advanced LDO structure, the proposed LDO provides high stability, as well as fast line and load transient responses, even in capacitor-free operation. The proposed LDO has been implemented in a commercial 0.6-μm CMOS technology, and the active chip area is 568 μm × 541 μm. The total error of the output voltage due to line and load variations is less than ±0.25%, and the temperature coefficient is 38 ppm/°C. Moreover, the output voltage can recover within 2 μs for full load-current changes. The power-supply rejection ratio at 1 MHz is -30 dB, and the output noise spectral densities at 100 Hz and 100 kHz are 1.8 and 0.38 μV/√Hz, respectively.
AB - A 1.5-V 100-mA capacitor-free CMOS low-dropout regulator (LDO) for system-on-chip applications to reduce board space and external pins is presented. By utilizing damping-factor-control frequency compensation on the advanced LDO structure, the proposed LDO provides high stability, as well as fast line and load transient responses, even in capacitor-free operation. The proposed LDO has been implemented in a commercial 0.6-μm CMOS technology, and the active chip area is 568 μm × 541 μm. The total error of the output voltage due to line and load variations is less than ±0.25%, and the temperature coefficient is 38 ppm/°C. Moreover, the output voltage can recover within 2 μs for full load-current changes. The power-supply rejection ratio at 1 MHz is -30 dB, and the output noise spectral densities at 100 Hz and 100 kHz are 1.8 and 0.38 μV/√Hz, respectively.
KW - CMOS voltage reference
KW - Capacitor-free low-dropout regulator (LDO)
KW - Damping-factor-control frequency compensation
KW - Loop-gain stability
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000185568500013
UR - https://openalex.org/W2034720635
UR - https://www.scopus.com/pages/publications/0141920411
U2 - 10.1109/JSSC.2003.817256
DO - 10.1109/JSSC.2003.817256
M3 - Journal Article
SN - 0018-9200
VL - 38
SP - 1691
EP - 1702
JO - IEEE Journal of Solid-State Circuits
JF - IEEE Journal of Solid-State Circuits
IS - 10
ER -