TY - JOUR
T1 - A charge-based model for long-channel cylindrical surrounding-gate MOSFETs from intrinsic channel to heavily doped body
AU - Liu, Feng
AU - He, Jin
AU - Zhang, Lining
AU - Zhang, Jian
AU - Hu, Jinghua
AU - Ma, Chenyue
AU - Chan, Mansun
PY - 2008
Y1 - 2008
N2 - A charge-based model is presented for long-channel cylindrical surrounding-gate (SRG) MOSFETs from an intrinsic channel to a heavily doped body. The model derivation is based on an accurate inversion charge solution of Poisson's equation in a cylindrical coordinate system. The general drain-current equation is obtained from Pao-Sah's dual integral, which is expressed as a function of inversion charge at the source and drain terminals. The model is valid for all regions of operation without employing any smoothing function. The model has been extensively verified by numerical simulations with a wide range of SRG MOSFET geometry parameters and channel doping concentrations, including the undoped channel.
AB - A charge-based model is presented for long-channel cylindrical surrounding-gate (SRG) MOSFETs from an intrinsic channel to a heavily doped body. The model derivation is based on an accurate inversion charge solution of Poisson's equation in a cylindrical coordinate system. The general drain-current equation is obtained from Pao-Sah's dual integral, which is expressed as a function of inversion charge at the source and drain terminals. The model is valid for all regions of operation without employing any smoothing function. The model has been extensively verified by numerical simulations with a wide range of SRG MOSFET geometry parameters and channel doping concentrations, including the undoped channel.
KW - Compact model
KW - Device physics
KW - Doping concentration
KW - Drain current
KW - Surrounding-gate (SRG) MOSFET
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000257950300055
UR - https://openalex.org/W2129588083
UR - https://www.scopus.com/pages/publications/49249128094
U2 - 10.1109/TED.2008.926735
DO - 10.1109/TED.2008.926735
M3 - Journal Article
SN - 0018-9383
VL - 55
SP - 2187
EP - 2194
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 8
ER -