A Generic Protocol for Highly Reproducible Manufacturing of Efficient Perovskite Light-Emitting Diodes Using In-Situ Photoluminescence Monitoring

Halide perovskite light-emitting diodes (PLEDs) have raised considerable attention due to their high color purity and rapid development performance. Although high-efficiency PLEDs have been continuously and repeatedly reported, the lack of a highly reproducible manufacturing process for PLEDs hinders their future development and commercialization. Here, a generic protocol for rational control of the nucleation and crystallization process of the perovskite emission layer is reported. Through the monitoring of the photoluminescence during spin-coating, the antisolvent dripping time can be precisely determined. Therefore, it is possible to repeatedly produce a perovskite emission layer with high PLQY, smooth surface/interface, and good homogeneity. As a result, high-performance PLEDs are easily obtained. Moreover, the standard deviation of the fabricated PLEDs performance is smaller than 0.8%, showing high reproducibility independent of the process conditions such as the process temperature, solvent atmosphere, and spin-coating parameters, which highlights the statement of the importance of rationally control of the antisolvent process. The methodology provides important progress towards highly reproducible manufacturing of PLEDs for practical applications.