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A high-performance five-channel NMOSFET using selective epitaxial growth and lateral solid phase epitaxy

  • Mahender Kumar
  • , Haitao Liu
  • , Johnny K.O. Sin*
  • *Corresponding author for this work

Research output: Contribution to journalLetterpeer-review

Abstract

In this letter, a novel Five-Channel NMOSFET (FC-NMOS) using selective epitaxial growth (SEG) and lateral solid phase epitaxy (LSPE) is reported. The FC-NMOS is an integration of a conventional bulk NMOS, two vertical NMOS, and a gate-all-around NMOS. The top silicon layer for implementing the gate-all-around structure is obtained by using the LSPE with the SEG pillar as the silicon seed. The FC-NMOS has a 3.6 × higher current drive as compared to the conventional bulk NMOS. This makes the FC-NMOS very promising for VLSI/ULSI applications.

Original languageEnglish
Pages (from-to)261-263
Number of pages3
JournalIEEE Electron Device Letters
Volume23
Issue number5
Publication statusPublished - May 2002

Keywords

  • Double-gate
  • Gate-all-around
  • Selective epitaxy
  • Solid-phase epitaxy
  • Vertical transistor

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