A High Sensitivity and Modulation Contrast Photonic Demodulator for Time-of-Flight Application

Shun Qi Dai, Cristine Jin Estrada, Annan Xiong, Songcen Xu, Huanmei Yuan, Chen Xu, Jie George Yuan, Mansun Chan

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

Abstract

This paper presents a new photonic demodulator with high sensitivity and modulation ability, which is important for Time-of-Flight (ToF) application. This proposed device called embedded guide gate photonic modulator or EGPD uses two gates inserted into the silicon to form an electric field to facilitate the extraction of the optical generated carrier in deep silicon. The influence of the embedded gate depth has been studied by TCAD simulation to achieve high sensitivity. To improve the frequency response of the EGPD with deep embedded gates, transfer channels are introduced into the embedded gates which makes the EGPD possible to be a potential device in the pixel of ToF CMOS image sensor.

Original languageEnglish
Title of host publication2023 International VLSI Symposium on Technology, Systems and Applications, VLSI-TSA/VLSI-DAT 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350334166
DOIs
Publication statusPublished - 2023
Event2023 International VLSI Symposium on Technology, Systems and Applications, VLSI-TSA/VLSI-DAT 2023 - Hsinchu, Taiwan, Province of China
Duration: 17 Apr 202320 Apr 2023

Publication series

Name2023 International VLSI Symposium on Technology, Systems and Applications, VLSI-TSA/VLSI-DAT 2023 - Proceedings

Conference

Conference2023 International VLSI Symposium on Technology, Systems and Applications, VLSI-TSA/VLSI-DAT 2023
Country/TerritoryTaiwan, Province of China
CityHsinchu
Period17/04/2320/04/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

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