TY - GEN
T1 - A hybrid scheme for compacting test responses with unknown values
AU - Chao, Mango C.T.
AU - Cheng, Kwang Ting
AU - Wang, Seongmoon
AU - Chakradhar, Srimat T.
AU - Wei, Wen Long
PY - 2007
Y1 - 2007
N2 - This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.
AB - This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000253303700082
UR - https://openalex.org/W4233920399
UR - https://www.scopus.com/pages/publications/50249088879
U2 - 10.1109/ICCAD.2007.4397316
DO - 10.1109/ICCAD.2007.4397316
M3 - Conference Paper published in a book
SN - 1424413826
SN - 9781424413829
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 513
EP - 519
BT - 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
T2 - 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Y2 - 4 November 2007 through 8 November 2007
ER -