A hybrid scheme for compacting test responses with unknown values

Mango C.T. Chao, Kwang Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wen Long Wei

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

3 Citations (Scopus)

Abstract

This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.

Original languageEnglish
Title of host publication2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Pages513-519
Number of pages7
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
Duration: 4 Nov 20078 Nov 2007

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Country/TerritoryUnited States
CitySan Jose, CA
Period4/11/078/11/07

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