Abstract
A novel static random-access memory (SRAM) cell with nine carbon nanotube MOSFETs (9-CN-MOSFETs) is proposed in this paper. With the new 9-CN-MOSFET SRAM cell, the read data stability is enhanced by 99.09%, while providing similar read speed as compared with the conventional six-transistor (6T) SRAM cell in a 16-nm carbon nanotube transistor technology. The worst-case write voltage margin is increased by 4.57 × and 3.90 × with the proposed 9-CN-MOSFET SRAM cell as compared with the conventional 6T SRAM cell and a previously published eight-transistor (8T) SRAM cell, respectively. A 1 Kibit SRAM array with the new memory cells consumes 34.18% and 12.27% lower leakage power as compared with the memory arrays with 6T and 8T SRAM cells, respectively, in idle mode. The overall electrical quality is enhanced by up to 13.63 × with the proposed 9-CN-MOSFET memory circuit as compared with the other memory cells that are evaluated in this paper.
| Original language | English |
|---|---|
| Article number | 6898832 |
| Pages (from-to) | 1729-1739 |
| Number of pages | 11 |
| Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
| Volume | 23 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1 Sept 2015 |
Bibliographical note
Publisher Copyright:© 1993-2012 IEEE.
Keywords
- Carbon based electronics
- carbon nanotube transistor technology
- electron mobility
- hole mobility
- leakage power consumption
- memory
- noise immunity
- read static noise margin
- write voltage margin
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