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A novel robust and low-leakage SRAM cell with nine carbon nanotube transistors

  • Yanan Sun
  • , Hailong Jiao
  • , Volkan Kursun

Research output: Contribution to journalJournal Articlepeer-review

Abstract

A novel static random-access memory (SRAM) cell with nine carbon nanotube MOSFETs (9-CN-MOSFETs) is proposed in this paper. With the new 9-CN-MOSFET SRAM cell, the read data stability is enhanced by 99.09%, while providing similar read speed as compared with the conventional six-transistor (6T) SRAM cell in a 16-nm carbon nanotube transistor technology. The worst-case write voltage margin is increased by 4.57 × and 3.90 × with the proposed 9-CN-MOSFET SRAM cell as compared with the conventional 6T SRAM cell and a previously published eight-transistor (8T) SRAM cell, respectively. A 1 Kibit SRAM array with the new memory cells consumes 34.18% and 12.27% lower leakage power as compared with the memory arrays with 6T and 8T SRAM cells, respectively, in idle mode. The overall electrical quality is enhanced by up to 13.63 × with the proposed 9-CN-MOSFET memory circuit as compared with the other memory cells that are evaluated in this paper.

Original languageEnglish
Article number6898832
Pages (from-to)1729-1739
Number of pages11
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume23
Issue number9
DOIs
Publication statusPublished - 1 Sept 2015

Bibliographical note

Publisher Copyright:
© 1993-2012 IEEE.

Keywords

  • Carbon based electronics
  • carbon nanotube transistor technology
  • electron mobility
  • hole mobility
  • leakage power consumption
  • memory
  • noise immunity
  • read static noise margin
  • write voltage margin

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