TY - GEN
T1 - A sigma-delta modulation based BIST scheme for mixed-signal circuits
AU - Huang, Jiun Lang
AU - Cheng, Kwang Ting
PY - 2000
Y1 - 2000
N2 - In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.
AB - In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.
UR - https://openalex.org/W2078335310
UR - https://www.scopus.com/pages/publications/84884688387
U2 - 10.1145/368434.368830
DO - 10.1145/368434.368830
M3 - Conference Paper published in a book
SN - 0780359747
SN - 9780780359741
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 605
EP - 610
BT - Proceedings of the 2000 Asia and South Pacific Design Automation Conference, ASP-DAC 2000
T2 - 2000 Asia and South Pacific Design Automation Conference, ASP-DAC 2000
Y2 - 25 January 2000 through 28 January 2000
ER -