A Study on Microstructure and Reliability Tests of Low Cost Flip Chip

Jian Cai, Philip C.H. Chan, Annette T. Cheung, Simon P.C. Law, Guowei Xiao

Research output: Contribution to conferenceConference Paper

Original languageEnglish
Publication statusPublished - 2001
EventThe Fourth International Symposium on Electronic Packaging Technology, Beijing, China -
Duration: 1 Jan 20011 Jan 2001

Conference

ConferenceThe Fourth International Symposium on Electronic Packaging Technology, Beijing, China
Period1/01/011/01/01

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