Automatic test pattern generation

^*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/Report › Book Chapter › peer-review

Original language	English
Title of host publication	EDA for IC System Design, Verification, and Testing
Publisher	CRC Press
ISBN (Electronic)	9781420007947
ISBN (Print)	9780849379239
Publication status	Published - 19 Apr 2016
Externally published	Yes

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