Bayesian fault identification of multistage processes

Yanting Li*, Fugee Tsung, Lifeng Xi

*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

1 Citation (Scopus)

Abstract

Multistage process fault identification have received much attention recently. In this article, we focus on identifying faults in multistage processes that affect the process mean vector. The new method utilizes Bayesian theory and evaluates the posterior probability of each possible fault scenarios. The scenario associated with the largest posterior probability is identified. Numerical analysis proves that the new method has satisfactory diagnosis power and accuracy.

Original languageEnglish
Title of host publicationIEEM 2009 - IEEE International Conference on Industrial Engineering and Engineering Management
Pages1357-1361
Number of pages5
DOIs
Publication statusPublished - 2009
EventIEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2009 - Hong Kong, China
Duration: 8 Dec 200911 Dec 2009

Publication series

NameIEEM 2009 - IEEE International Conference on Industrial Engineering and Engineering Management

Conference

ConferenceIEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2009
Country/TerritoryChina
CityHong Kong
Period8/12/0911/12/09

Keywords

  • Bayesian theory
  • Fault diagnosis
  • Multistage processes
  • State space model

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