'BNN - BN = ?': Training binary neural networks without batch normalization

Tianlong Chen, Zhenyu Zhang, Xu Ouyang, Zechun Liu, Zhiqiang Shen, Zhangyang Wang

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

43 Citations (Scopus)

Abstract

Batch normalization (BN) is a key facilitator and considered essential for state-of-the-art binary neural networks (BNN). However, the BN layer is costly to calculate and is typically implemented with non-binary parameters, leaving a hurdle for the efficient implementation of BNN training. It also introduces undesirable dependence between samples within each batch. Inspired by the latest advance on Batch Normalization Free (BN-Free) training [7], we extend their framework to training BNNs, and for the first time demonstrate that BNs can be completely removed from BNN training and inference regimes. By plugging in and customizing techniques including adaptive gradient clipping, scale weight standardization, and specialized bottleneck block, a BN-free BNN is capable of maintaining competitive accuracy compared to its BN-based counterpart. Extensive experiments validate the effectiveness of our proposal across diverse BNN backbones and datasets. For example, after removing BNs from the state-of-the-art ReActNets [38], it can still be trained with our proposed methodology to achieve 92.08%, 68.34%, and 68.0% accuracy on CIFAR-10, CIFAR-100, and ImageNet respectively, with marginal performance drop (0.23% ∼ 0.44% on CIFAR and 1.40% on ImageNet). Codes and pre-trained models are available at: https://github.com/VITA-Group/BNN_NoBN.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
PublisherIEEE Computer Society
Pages4614-4624
Number of pages11
ISBN (Electronic)9781665448994
DOIs
Publication statusPublished - Jun 2021
Externally publishedYes
Event2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 - Virtual, Online, United States
Duration: 19 Jun 202125 Jun 2021

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
Country/TerritoryUnited States
CityVirtual, Online
Period19/06/2125/06/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

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