Skip to main navigation Skip to search Skip to main content

Characterization and suppression of anti-phase-boundary defects in GaAs-on-Si films using SHG and aspect-ratio-trapping

Research output: Contribution to conference › Conference Paper › peer-review

Original languageEnglish
Publication statusPublished - Mar 2014
Externally publishedYes
Event2014 American Physical Society March Meeting (APS 2014) -
Duration: 1 Mar 2014 → 1 Mar 2014

Conference

Conference2014 American Physical Society March Meeting (APS 2014)
Period1/03/14 → 1/03/14

Cite this