Characterization of Strain Rate-Dependent Behavior of 63Sn-37Pb Solder Alloy

Lan Hong Dai*, Shi Wei Ricky Lee

*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

3 Citations (Scopus)

Abstract

A novel punch shear testing method is introduced in this study to investigate the strain rate-dependent shear behavior of solder materials. Both static and dynamic shear strengths of 63 Sn-37Pb solder were characterized. The experimental results indicate that the shear response of solder alloy is very sensitive to the strain rate and the dynamic shear strength is much higher than the static one. Besides, the localized crack band was found in the dynamic punch shear tests. This phenomenon reveals that the adiabatic shear localization should be a significant mechanism for controlling the mechanical behavior of 63Sn-37Pb solder alloy under dynamic shear loading.

Original languageEnglish
Title of host publicationAdvances in Electronic Packaging; Electrical Design, Simulation, and Test, Mems, Materials and Processing, Modeling and Characterization
PublisherAmerican Society of Mechanical Engineers
Pages307-313
Number of pages7
ISBN (Print)0791835405, 9780791835401
Publication statusPublished - 2001
EventPacific Rim/International, Intersociety Electronic Packaging Technical/Business Conference and Exhibition - Kauai, Hi, United States
Duration: 8 Jul 200113 Jul 2001

Publication series

NameAdvances in Electronic Packaging
Volume1

Conference

ConferencePacific Rim/International, Intersociety Electronic Packaging Technical/Business Conference and Exhibition
Country/TerritoryUnited States
CityKauai, Hi
Period8/07/0113/07/01

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