Compact modeling of FinFETs featuring independent-gate operation mode

C. H. Lin; X. Xi; J. He; L. Chang; R. Q. Williams; M. B. Kelchen; W. E. Haensch; M. Dunga; S. Balasubramanian; A. M. Niknejad; M. Chan; C. Hu

doi:10.1109/VTSA.2005.1497105

Compact modeling of FinFETs featuring independent-gate operation mode

C. H. Lin^*, X. Xi, J. He, L. Chang, R. Q. Williams, M. B. Kelchen, W. E. Haensch, M. Dunga, S. Balasubramanian, A. M. Niknejad, M. Chan, C. Hu

^*Corresponding author for this work

Department of Electronic and Computer Engineering

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

8 Citations (Scopus)

Original language	English
Title of host publication	2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers
Pages	120-121
Number of pages	2
DOIs	https://doi.org/10.1109/VTSA.2005.1497105
Publication status	Published - 2005
Event	2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH - Hsinchu, Taiwan, Province of China Duration: 25 Apr 2005 → 27 Apr 2005

Publication series

Name	2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers

Conference

Conference	2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH
Country/Territory	Taiwan, Province of China
City	Hsinchu
Period	25/04/05 → 27/04/05

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10.1109/VTSA.2005.1497105

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Lin, C. H., Xi, X., He, J., Chang, L., Williams, R. Q., Kelchen, M. B., Haensch, W. E., Dunga, M., Balasubramanian, S., Niknejad, A. M., Chan, M., & Hu, C. (2005). Compact modeling of FinFETs featuring independent-gate operation mode. In 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers (pp. 120-121). Article T77 (2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers). https://doi.org/10.1109/VTSA.2005.1497105

@inproceedings{1751636cded14bde8968cb2e587965f0,

title = "Compact modeling of FinFETs featuring independent-gate operation mode",

author = "Lin, \{C. H.\} and X. Xi and J. He and L. Chang and Williams, \{R. Q.\} and Kelchen, \{M. B.\} and Haensch, \{W. E.\} and M. Dunga and S. Balasubramanian and Niknejad, \{A. M.\} and M. Chan and C. Hu",

year = "2005",

doi = "10.1109/VTSA.2005.1497105",

language = "English",

isbn = "078039058X",

series = "2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers",

pages = "120--121",

booktitle = "2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers",

note = "2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH ; Conference date: 25-04-2005 Through 27-04-2005",

}

Lin, CH, Xi, X, He, J, Chang, L, Williams, RQ, Kelchen, MB, Haensch, WE, Dunga, M, Balasubramanian, S, Niknejad, AM, Chan, M & Hu, C 2005, Compact modeling of FinFETs featuring independent-gate operation mode. in 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers., T77, 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers, pp. 120-121, 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Hsinchu, Taiwan, Province of China, 25/04/05. https://doi.org/10.1109/VTSA.2005.1497105

Compact modeling of FinFETs featuring independent-gate operation mode. / Lin, C. H.; Xi, X.; He, J. et al.
2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers. 2005. p. 120-121 T77 (2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers).

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

TY - GEN

T1 - Compact modeling of FinFETs featuring independent-gate operation mode

AU - Lin, C. H.

AU - Xi, X.

AU - He, J.

AU - Chang, L.

AU - Williams, R. Q.

AU - Kelchen, M. B.

AU - Haensch, W. E.

AU - Dunga, M.

AU - Balasubramanian, S.

AU - Niknejad, A. M.

AU - Chan, M.

AU - Hu, C.

PY - 2005

Y1 - 2005

UR - https://openalex.org/W2126333818

UR - https://www.scopus.com/pages/publications/27144506585

U2 - 10.1109/VTSA.2005.1497105

DO - 10.1109/VTSA.2005.1497105

M3 - Conference Paper published in a book

SN - 078039058X

SN - 9780780390584

T3 - 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers

SP - 120

EP - 121

BT - 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers

T2 - 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH

Y2 - 25 April 2005 through 27 April 2005

ER -

Lin CH, Xi X, He J, Chang L, Williams RQ, Kelchen MB et al. Compact modeling of FinFETs featuring independent-gate operation mode. In 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers. 2005. p. 120-121. T77. (2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers). doi: 10.1109/VTSA.2005.1497105

Compact modeling of FinFETs featuring independent-gate operation mode

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