Defect Detection Method and System Using High Frequency Waves: [United States]

Georgios GRIGOROPOULOS (Inventor), Moez LOUATI (Inventor), Mohamed Salah GHIDAOUI (Key Inventor), Saber NASRAOUI (Inventor)

Research output: Patent

Cite this

@misc{b9b0bfcf0d3e4f0e80e34795c0fb37dc,

title = "Defect Detection Method and System Using High Frequency Waves: [United States]",

author = "Georgios GRIGOROPOULOS and Moez LOUATI and GHIDAOUI, \{Mohamed Salah\} and Saber NASRAOUI",

year = "2024",

month = jul,

day = "4",

language = "English",

type = "Patent",

note = "G01N 29/34, G01N 29/12, G01N 29/24, G01N 29/36",

}