Design and test for reliability and efficiency

Tim Cheng

doi:10.1109/MDT.2008.163

Design and test for reliability and efficiency

Tim Cheng

Office of the Vice-President for Research and Development

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	508
Number of pages	1
Journal	IEEE Design and Test of Computers
Volume	25
Issue number	6
DOIs	https://doi.org/10.1109/MDT.2008.163
Publication status	Published - 2008

Keywords

Buildings
Design methodology
Nanoscale devices
Reliability
Reliability engineering
Security
Semiconductor device reliability

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10.1109/MDT.2008.163

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title = "Design and test for reliability and efficiency",

keywords = "Buildings, Design methodology, Nanoscale devices, Reliability, Reliability engineering, Security, Semiconductor device reliability",

author = "Tim Cheng",

year = "2008",

doi = "10.1109/MDT.2008.163",

language = "English",

volume = "25",

pages = "508",

journal = "IEEE Design and Test of Computers",

issn = "0740-7475",

publisher = "IEEE Computer Society",

number = "6",

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T1 - Design and test for reliability and efficiency

AU - Cheng, Tim

PY - 2008

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KW - Design methodology

KW - Nanoscale devices

KW - Reliability

KW - Reliability engineering

KW - Security

KW - Semiconductor device reliability

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DO - 10.1109/MDT.2008.163

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VL - 25

SP - 508

JO - IEEE Design and Test of Computers

JF - IEEE Design and Test of Computers

IS - 6

ER -

Design and test for reliability and efficiency

Keywords

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