Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests

Grace G. Zhang; Sophie L.Y. Lu; Nick G.M. Yang; Sam H.Y. Zou; Steven D.L. Zhong; Jeffery C.C. Lo; S. W.Ricky Lee

doi:10.1109/ICEPT.2014.6922933

Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests

Grace G. Zhang^*, Sophie L.Y. Lu, Nick G.M. Yang, Sam H.Y. Zou, Steven D.L. Zhong, Jeffery C.C. Lo, S. W.Ricky Lee

^*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

3 Citations (Scopus)

Abstract

In this paper, a fully automated, low-cost, real-time illuminance measurement system for LED long term reliability tests is proposed. The system has only one photodetector to measure the illuminance of all samples inside the test chamber during the reliability test. With a proprietary algorithm, a single photodetector can measure the illuminance of all samples in the chamber by sequential scanning. This system monitors and records the illuminance of each individual sample inside the test chamber. This provides continuous and reliable data for analysis and prediction of LED lifespan. It does not require suspending the reliability test for sample inspection and can automatically analyze the time-to-failure of samples. The proposed system can significantly reduce the time required for data acquisition and measurement errors. This paper also compares the results obtained from the proposed system and the conventional periodic inspection to highlight the merits of the new system.

Original language	English
Title of host publication	2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014
Editors	Keyun Bi, Zhong Tian, Ziqiang Xu
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1477-1481
Number of pages	5
ISBN (Electronic)	9781479947072
DOIs	https://doi.org/10.1109/ICEPT.2014.6922933
Publication status	Published - 13 Oct 2014
Event	2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014 - Chengdu, China Duration: 12 Aug 2014 → 15 Aug 2014

Publication series

Name	Proceedings of the Electronic Packaging Technology Conference, EPTC

Conference

Conference	2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014
Country/Territory	China
City	Chengdu
Period	12/08/14 → 15/08/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

Keywords

LED
illuminance
reliability

Access to Document

10.1109/ICEPT.2014.6922933

Cite this

Zhang, G. G., Lu, S. L. Y., Yang, N. G. M., Zou, S. H. Y., Zhong, S. D. L., Lo, J. C. C., & Lee, S. W. R. (2014). Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests. In K. Bi, Z. Tian, & Z. Xu (Eds.), 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014 (pp. 1477-1481). Article 6922933 (Proceedings of the Electronic Packaging Technology Conference, EPTC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEPT.2014.6922933

Zhang, Grace G. ; Lu, Sophie L.Y. ; Yang, Nick G.M. et al. / Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests. 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014. editor / Keyun Bi ; Zhong Tian ; Ziqiang Xu. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 1477-1481 (Proceedings of the Electronic Packaging Technology Conference, EPTC).

@inproceedings{bcd0d68cc14a47c88e958f0526d8631b,

title = "Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests",

abstract = "In this paper, a fully automated, low-cost, real-time illuminance measurement system for LED long term reliability tests is proposed. The system has only one photodetector to measure the illuminance of all samples inside the test chamber during the reliability test. With a proprietary algorithm, a single photodetector can measure the illuminance of all samples in the chamber by sequential scanning. This system monitors and records the illuminance of each individual sample inside the test chamber. This provides continuous and reliable data for analysis and prediction of LED lifespan. It does not require suspending the reliability test for sample inspection and can automatically analyze the time-to-failure of samples. The proposed system can significantly reduce the time required for data acquisition and measurement errors. This paper also compares the results obtained from the proposed system and the conventional periodic inspection to highlight the merits of the new system.",

keywords = "LED, illuminance, reliability",

author = "Zhang, \{Grace G.\} and Lu, \{Sophie L.Y.\} and Yang, \{Nick G.M.\} and Zou, \{Sam H.Y.\} and Zhong, \{Steven D.L.\} and Lo, \{Jeffery C.C.\} and Lee, \{S. W.Ricky\}",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014 ; Conference date: 12-08-2014 Through 15-08-2014",

year = "2014",

month = oct,

day = "13",

doi = "10.1109/ICEPT.2014.6922933",

language = "English",

series = "Proceedings of the Electronic Packaging Technology Conference, EPTC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1477--1481",

editor = "Keyun Bi and Zhong Tian and Ziqiang Xu",

booktitle = "2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014",

}

Zhang, GG, Lu, SLY, Yang, NGM, Zou, SHY, Zhong, SDL, Lo, JCC & Lee, SWR 2014, Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests. in K Bi, Z Tian & Z Xu (eds), 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014., 6922933, Proceedings of the Electronic Packaging Technology Conference, EPTC, Institute of Electrical and Electronics Engineers Inc., pp. 1477-1481, 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014, Chengdu, China, 12/08/14. https://doi.org/10.1109/ICEPT.2014.6922933

Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests. / Zhang, Grace G.; Lu, Sophie L.Y.; Yang, Nick G.M. et al.
2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014. ed. / Keyun Bi; Zhong Tian; Ziqiang Xu. Institute of Electrical and Electronics Engineers Inc., 2014. p. 1477-1481 6922933 (Proceedings of the Electronic Packaging Technology Conference, EPTC).

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

TY - GEN

T1 - Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests

AU - Zhang, Grace G.

AU - Lu, Sophie L.Y.

AU - Yang, Nick G.M.

AU - Zou, Sam H.Y.

AU - Zhong, Steven D.L.

AU - Lo, Jeffery C.C.

AU - Lee, S. W.Ricky

PY - 2014/10/13

Y1 - 2014/10/13

N2 - In this paper, a fully automated, low-cost, real-time illuminance measurement system for LED long term reliability tests is proposed. The system has only one photodetector to measure the illuminance of all samples inside the test chamber during the reliability test. With a proprietary algorithm, a single photodetector can measure the illuminance of all samples in the chamber by sequential scanning. This system monitors and records the illuminance of each individual sample inside the test chamber. This provides continuous and reliable data for analysis and prediction of LED lifespan. It does not require suspending the reliability test for sample inspection and can automatically analyze the time-to-failure of samples. The proposed system can significantly reduce the time required for data acquisition and measurement errors. This paper also compares the results obtained from the proposed system and the conventional periodic inspection to highlight the merits of the new system.

AB - In this paper, a fully automated, low-cost, real-time illuminance measurement system for LED long term reliability tests is proposed. The system has only one photodetector to measure the illuminance of all samples inside the test chamber during the reliability test. With a proprietary algorithm, a single photodetector can measure the illuminance of all samples in the chamber by sequential scanning. This system monitors and records the illuminance of each individual sample inside the test chamber. This provides continuous and reliable data for analysis and prediction of LED lifespan. It does not require suspending the reliability test for sample inspection and can automatically analyze the time-to-failure of samples. The proposed system can significantly reduce the time required for data acquisition and measurement errors. This paper also compares the results obtained from the proposed system and the conventional periodic inspection to highlight the merits of the new system.

KW - LED

KW - illuminance

KW - reliability

UR - https://openalex.org/W2011871664

UR - https://www.scopus.com/pages/publications/84908105420

U2 - 10.1109/ICEPT.2014.6922933

DO - 10.1109/ICEPT.2014.6922933

M3 - Conference Paper published in a book

T3 - Proceedings of the Electronic Packaging Technology Conference, EPTC

SP - 1477

EP - 1481

BT - 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014

A2 - Bi, Keyun

A2 - Tian, Zhong

A2 - Xu, Ziqiang

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014

Y2 - 12 August 2014 through 15 August 2014

ER -

Zhang GG, Lu SLY, Yang NGM, Zou SHY, Zhong SDL, Lo JCC et al. Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests. In Bi K, Tian Z, Xu Z, editors, 2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 1477-1481. 6922933. (Proceedings of the Electronic Packaging Technology Conference, EPTC). doi: 10.1109/ICEPT.2014.6922933

Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests

Abstract

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Bibliographical note

Keywords

Access to Document

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