Digitally-assisted analog/RF testing for mixed-signal SoCs

Hsiu Ming Chang; Min Sheng Lin; Kwang Ting Cheng

doi:10.1109/ATS.2008.24

Digitally-assisted analog/RF testing for mixed-signal SoCs

Hsiu Ming Chang^*, Min Sheng Lin, Kwang Ting Cheng

^*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

22 Citations (Scopus)

Abstract

We propose a testing methodology for analog and radio-frequency (RF) circuitry that incorporates digital circuits for performance calibration and adaptation. We explore the reuse of built-in digital calibration circuitry, along with minor digital design-for-testability (DfT) modifications, to test and characterize analog/RF circuit performance. By observing the digital tuning signals captured in the digital calibration circuitry, the analog/RF performance can be closely estimated, thus enabling cost-effective Go/No-Go production testing. In this paper, we illustrate this testing methodology using a case study of a digitally-calibrated Weaver image-reject receiver.

Original language	English
Title of host publication	Proceedings of the 17th Asian Test Symposium, ATS 2008
Pages	43-48
Number of pages	6
DOIs	https://doi.org/10.1109/ATS.2008.24
Publication status	Published - 2008
Externally published	Yes
Event	17th Asian Test Symposium, ATS 2008 - Sapporo, Japan Duration: 24 Nov 2008 → 27 Nov 2008

Publication series

Name	Proceedings of the Asian Test Symposium
ISSN (Print)	1081-7735

Conference

Conference	17th Asian Test Symposium, ATS 2008
Country/Territory	Japan
City	Sapporo
Period	24/11/08 → 27/11/08

Keywords

Analog testing
Digital calibration
Mixed-signal testing
RF testing
Self-tuning circuit

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10.1109/ATS.2008.24

Cite this

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title = "Digitally-assisted analog/RF testing for mixed-signal SoCs",

abstract = "We propose a testing methodology for analog and radio-frequency (RF) circuitry that incorporates digital circuits for performance calibration and adaptation. We explore the reuse of built-in digital calibration circuitry, along with minor digital design-for-testability (DfT) modifications, to test and characterize analog/RF circuit performance. By observing the digital tuning signals captured in the digital calibration circuitry, the analog/RF performance can be closely estimated, thus enabling cost-effective Go/No-Go production testing. In this paper, we illustrate this testing methodology using a case study of a digitally-calibrated Weaver image-reject receiver.",

keywords = "Analog testing, Digital calibration, Mixed-signal testing, RF testing, Self-tuning circuit",

author = "Chang, \{Hsiu Ming\} and Lin, \{Min Sheng\} and Cheng, \{Kwang Ting\}",

year = "2008",

doi = "10.1109/ATS.2008.24",

language = "English",

isbn = "9780769533964",

series = "Proceedings of the Asian Test Symposium",

pages = "43--48",

booktitle = "Proceedings of the 17th Asian Test Symposium, ATS 2008",

note = "17th Asian Test Symposium, ATS 2008 ; Conference date: 24-11-2008 Through 27-11-2008",

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AU - Chang, Hsiu Ming

AU - Lin, Min Sheng

AU - Cheng, Kwang Ting

PY - 2008

Y1 - 2008

N2 - We propose a testing methodology for analog and radio-frequency (RF) circuitry that incorporates digital circuits for performance calibration and adaptation. We explore the reuse of built-in digital calibration circuitry, along with minor digital design-for-testability (DfT) modifications, to test and characterize analog/RF circuit performance. By observing the digital tuning signals captured in the digital calibration circuitry, the analog/RF performance can be closely estimated, thus enabling cost-effective Go/No-Go production testing. In this paper, we illustrate this testing methodology using a case study of a digitally-calibrated Weaver image-reject receiver.

AB - We propose a testing methodology for analog and radio-frequency (RF) circuitry that incorporates digital circuits for performance calibration and adaptation. We explore the reuse of built-in digital calibration circuitry, along with minor digital design-for-testability (DfT) modifications, to test and characterize analog/RF circuit performance. By observing the digital tuning signals captured in the digital calibration circuitry, the analog/RF performance can be closely estimated, thus enabling cost-effective Go/No-Go production testing. In this paper, we illustrate this testing methodology using a case study of a digitally-calibrated Weaver image-reject receiver.

KW - Analog testing

KW - Digital calibration

KW - Mixed-signal testing

KW - RF testing

KW - Self-tuning circuit

UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000264408100006

UR - https://openalex.org/W2049372902

UR - https://www.scopus.com/pages/publications/58249122760

U2 - 10.1109/ATS.2008.24

DO - 10.1109/ATS.2008.24

M3 - Conference Paper published in a book

SN - 9780769533964

T3 - Proceedings of the Asian Test Symposium

SP - 43

EP - 48

BT - Proceedings of the 17th Asian Test Symposium, ATS 2008

T2 - 17th Asian Test Symposium, ATS 2008

Y2 - 24 November 2008 through 27 November 2008

ER -

Digitally-assisted analog/RF testing for mixed-signal SoCs

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Keywords

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