Drop impact and reliability design of typical portable electronic device

T.X. Yu

Research output: Contribution to conference › Conference Paper

Original languageEnglish
Publication statusPublished - 2006
EventThe 2nd HKUST-KAIST Joint Workshop on Advanced Materials and Electronic Packaging, Daejeon, Korea -
Duration: 1 Jan 2006 → 1 Jan 2006

Conference

ConferenceThe 2nd HKUST-KAIST Joint Workshop on Advanced Materials and Electronic Packaging, Daejeon, Korea
Period1/01/06 → 1/01/06

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