TY - GEN
T1 - Drop impact of a typical portable electronic device
AU - Zhou, C. Y.
AU - Yu, T. X.
AU - Lee, R. S.W.
PY - 2006
Y1 - 2006
N2 - Drop impact reliability is an important concern for the design and use of portable electronic products. When the product is accidentally dropped on the ground, impact forces are transmitted from the product case to the printed circuit board (PCB) and other components within the case. These forces may cause severe functional damage in the form of component failure and/or interconnection breakage. This paper reports our investigation on the dynamic behaviours of a typical portable electronic device under drop impact loading. Firstly, an idealized system which contains an outer case and a PCB attached with a package was adopted as specimen. With an innovative design, the actual impact force pulses were measured by employing a Hopkinson bar in the dynamic test rig. Dynamic strains of the PCB were simultaneously recorded to explore the correlation between the strains and the impact pulse. Particular attention has been paid to the dependence of the shock response of the PCB on the impact velocity, impact force pulse, as well as the impact orientation. Analysis is carried out to explain the experimental results. A deep understanding of the shock response of typical electronic product systems will help to guide the design of rugged and highly impact-resistant devices.
AB - Drop impact reliability is an important concern for the design and use of portable electronic products. When the product is accidentally dropped on the ground, impact forces are transmitted from the product case to the printed circuit board (PCB) and other components within the case. These forces may cause severe functional damage in the form of component failure and/or interconnection breakage. This paper reports our investigation on the dynamic behaviours of a typical portable electronic device under drop impact loading. Firstly, an idealized system which contains an outer case and a PCB attached with a package was adopted as specimen. With an innovative design, the actual impact force pulses were measured by employing a Hopkinson bar in the dynamic test rig. Dynamic strains of the PCB were simultaneously recorded to explore the correlation between the strains and the impact pulse. Particular attention has been paid to the dependence of the shock response of the PCB on the impact velocity, impact force pulse, as well as the impact orientation. Analysis is carried out to explain the experimental results. A deep understanding of the shock response of typical electronic product systems will help to guide the design of rugged and highly impact-resistant devices.
KW - Drop test
KW - Impact
KW - Portable electronic products
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000239959700048
UR - https://openalex.org/W2021695885
UR - https://www.scopus.com/pages/publications/36148989938
U2 - 10.2495/SU060481
DO - 10.2495/SU060481
M3 - Conference Paper published in a book
SN - 1845641752
SN - 9781845641757
T3 - WIT Transactions on the Built Environment
SP - 505
EP - 514
BT - Structures Under Shock and Impact IX
T2 - 9th International Conference on Structures Under Shock And Impact 2006, SUSI 2006, SU06
Y2 - 3 July 2006 through 5 July 2006
ER -