Drop impact of a typical portable electronic device

C. Y. Zhou*, T. X. Yu, R. S.W. Lee

*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

Abstract

Drop impact reliability is an important concern for the design and use of portable electronic products. When the product is accidentally dropped on the ground, impact forces are transmitted from the product case to the printed circuit board (PCB) and other components within the case. These forces may cause severe functional damage in the form of component failure and/or interconnection breakage. This paper reports our investigation on the dynamic behaviours of a typical portable electronic device under drop impact loading. Firstly, an idealized system which contains an outer case and a PCB attached with a package was adopted as specimen. With an innovative design, the actual impact force pulses were measured by employing a Hopkinson bar in the dynamic test rig. Dynamic strains of the PCB were simultaneously recorded to explore the correlation between the strains and the impact pulse. Particular attention has been paid to the dependence of the shock response of the PCB on the impact velocity, impact force pulse, as well as the impact orientation. Analysis is carried out to explain the experimental results. A deep understanding of the shock response of typical electronic product systems will help to guide the design of rugged and highly impact-resistant devices.

Original languageEnglish
Title of host publicationStructures Under Shock and Impact IX
Pages505-514
Number of pages10
DOIs
Publication statusPublished - 2006
Event9th International Conference on Structures Under Shock And Impact 2006, SUSI 2006, SU06 - The New Forest, United Kingdom
Duration: 3 Jul 20065 Jul 2006

Publication series

NameWIT Transactions on the Built Environment
Volume87
ISSN (Print)1743-3509

Conference

Conference9th International Conference on Structures Under Shock And Impact 2006, SUSI 2006, SU06
Country/TerritoryUnited Kingdom
CityThe New Forest
Period3/07/065/07/06

Keywords

  • Drop test
  • Impact
  • Portable electronic products

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