Dynamic Reliability of Bridged-Grain Poly-Si Thin-Film Transistor with Laser Interference Lithography Technology

Rongsheng Chen, Hoi Sing Kwok, Man Wong, Zhihe Xia, Meng Zhang, Wei Zhou

Research output: Contribution to conference › Conference Paper

Original language	English
Publication status	Published - Aug 2015
Event	The International Display Manufacturing Conference & 3D Systems and Applications 2015 - Duration: 1 Aug 2015 → 1 Aug 2015

Conference	The International Display Manufacturing Conference & 3D Systems and Applications 2015
Period	1/08/15 → 1/08/15

Access to Document

@conference{f11ebbe9ad1e4da2b7c30a74aaff9ae1,

title = "Dynamic Reliability of Bridged-Grain Poly-Si Thin-Film Transistor with Laser Interference Lithography Technology",

author = "Rongsheng Chen and Kwok, \{Hoi Sing\} and Man Wong and Zhihe Xia and Meng Zhang and Wei Zhou",

year = "2015",

month = aug,

language = "English",

note = "The International Display Manufacturing Conference \& 3D Systems and Applications 2015 ; Conference date: 01-08-2015 Through 01-08-2015",

}

TY - CONF

T1 - Dynamic Reliability of Bridged-Grain Poly-Si Thin-Film Transistor with Laser Interference Lithography Technology

AU - Chen, Rongsheng

AU - Kwok, Hoi Sing

AU - Wong, Man

AU - Xia, Zhihe

AU - Zhang, Meng

AU - Zhou, Wei

PY - 2015/8

Y1 - 2015/8

M3 - Conference Paper

T2 - The International Display Manufacturing Conference & 3D Systems and Applications 2015

Y2 - 1 August 2015 through 1 August 2015

ER -