Edge-Dependent of Threshold Voltage in MoS2 Nanoribbon-Based 2D FETs

Edge-Dependent of Threshold Voltage in MoS₂ Nanoribbon-Based 2D FETs

^*Corresponding author for this work

Research output: Contribution to conference › Conference Paper › peer-review

Original language	English
Publication status	Published - 2024
Event	2024 IEEE 17th International Conference on Solid-State and Integrated Circuit Technology - Duration: 1 Jan 2024 → 1 Jan 2024

Conference	2024 IEEE 17th International Conference on Solid-State and Integrated Circuit Technology
Period	1/01/24 → 1/01/24

@conference{13e0f7def82140968b597b3dcf0bf70f,

title = "Edge-Dependent of Threshold Voltage in MoS2 Nanoribbon-Based 2D FETs",

author = "Zhirong Peng and Mansun Chan",

year = "2024",

language = "English",

note = "2024 IEEE 17th International Conference on Solid-State and Integrated Circuit Technology ; Conference date: 01-01-2024 Through 01-01-2024",

}