Effective silicon debug is key for time to money

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	204
Number of pages	1
Journal	IEEE Design and Test of Computers
Volume	25
Issue number	3
DOIs	https://doi.org/10.1109/MDT.2008.64
Publication status	Published - May 2008

Access to Document

@article{1301c0e8496640239b40d2413f1fa3b2,

title = "Effective silicon debug is key for time to money",

author = "Tim Cheng",

year = "2008",

month = may,

doi = "10.1109/MDT.2008.64",

language = "English",

volume = "25",

pages = "204",

journal = "IEEE Design and Test of Computers",

issn = "0740-7475",

publisher = "IEEE Computer Society",

number = "3",

}

TY - JOUR

T1 - Effective silicon debug is key for time to money

AU - Cheng, Tim

PY - 2008/5

Y1 - 2008/5

UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000256156200001

UR - https://openalex.org/W2081826942

UR - https://www.scopus.com/pages/publications/45149095941

U2 - 10.1109/MDT.2008.64

DO - 10.1109/MDT.2008.64

M3 - Editorial

SN - 0740-7475

VL - 25

SP - 204

JO - IEEE Design and Test of Computers

JF - IEEE Design and Test of Computers

IS - 3

ER -