Abstract
In this study, the effects of growth interruptions on Al0.17Ga0.83As/GaAs and GaAs/ InxGa1-xAs quantum wells (QWs) grown by organometallic chemical vapor deposition (OMCVD) were assessed using low-temperature photoluminescence (PL) and photoluminescence excitation (PLE) spectroscopies. Growth interruption times were varied between 60, 10, and 0 sec. For both material systems, as the interruption time was reduced, the ground-state QW transition energies increased, while the linewidths of the peaks decreased. For the Al0.17Ga0.83As/GaAs structures, 5 K PL data suggests that the incorporation of impurities is enhanced by longer growth interruption times. In addition, as the interruption time was reduced, the energy separation between the 5 K PL and PLE peaks (Stokes shift) decreased, and was as low as 2.6 meV for no interruption. For GaAs/In0.11Ga0.89As samples, 2 K PL data indicated that the incorporation of donor species was not a function of the growth interruption time.
| Original language | English |
|---|---|
| Pages (from-to) | 197-201 |
| Number of pages | 5 |
| Journal | Journal of Electronic Materials |
| Volume | 20 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Feb 1991 |
| Externally published | Yes |
Keywords
- Quantum wells
- atmospheric pressure OMCVD
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