Electrically pumped InP/GaAsP quantum dot lasers grown on (001) Si emitting at 750 nm

Wei Luo, Liying Lin, Jie Huang, Qi Lin, Kei May Lau*

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

15 Citations (Scopus)

Abstract

Excellent performance of InAs quantum dot (QD) lasers grown on Si in the datacom and telecom bands has been reported in recent years. InP QD lasers on Si with emission wavelength at 650 nm–750 nm are seldom explored. In this paper, we report the growth and room temperature lasing of electrically pumped InP/GaAsP QD lasers directly grown on (001) Si emitting at 750 nm. The lowest threshold current density obtained is ∼650 A/cm2, measured on a 2 mm × 70 µm device. Moreover, the highest operating temperature of the InP QD laser grown on the GaAs/Si template is above 95°C. This 750 nm near red on-chip light source for the monolithic integration of Si photonics is potentially applicable in display, bio-photonics, and spatial mapping.

Original languageEnglish
Pages (from-to)40750-40755
Number of pages6
JournalOptics Express
Volume30
Issue number22
DOIs
Publication statusPublished - 24 Oct 2022

Bibliographical note

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© 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement.

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