Electron field emission from silicon nanowires

Frederick C.K. Au, K. W. Wong, Y. H. Tang, Y. F. Zhang, I. Bello, S. T. Lee

Research output: Contribution to journalJournal Articlepeer-review

213 Citations (Scopus)

Abstract

Silicon nanowires were prepared by laser ablation and hydrogen plasma treatment. The electron field emission phenomena were examined by measuring the current-voltage and current-electric field characteristics of the silicon-nanowire films at varying anode-sample separations and nanowire diameters, respectively. The work function, emission area, and field-enhancing factor were determined using the Fowler-Nordheim equation with the results of the current-voltage characteristics analysis.

Original languageEnglish
Pages (from-to)1700-1702
Number of pages3
JournalApplied Physics Letters
Volume75
Issue number12
DOIs
Publication statusPublished - 20 Sept 1999
Externally publishedYes

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