Erratum: Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))

Jin He; Zhang Xing; Yangyuan Wang; Xuemei Xi; Mansun Chan; Chenming Hu

doi:10.1016/j.mejo.2010.09.001

Erratum: Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))

Jin He^*, Zhang Xing, Yangyuan Wang, Xuemei Xi, Mansun Chan, Chenming Hu

^*Corresponding author for this work

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	693
Number of pages	1
Journal	Microelectronics Journal
Volume	41
Issue number	10
DOIs	https://doi.org/10.1016/j.mejo.2010.09.001
Publication status	Published - Oct 2010
Externally published	Yes

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10.1016/j.mejo.2010.09.001

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title = "Erratum: Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))",

author = "Jin He and Zhang Xing and Yangyuan Wang and Xuemei Xi and Mansun Chan and Chenming Hu",

year = "2010",

month = oct,

doi = "10.1016/j.mejo.2010.09.001",

language = "English",

volume = "41",

pages = "693",

journal = "Microelectronics Journal",

issn = "0026-2692",

publisher = "Elsevier Ltd",

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T2 - Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))

AU - He, Jin

AU - Xing, Zhang

AU - Wang, Yangyuan

AU - Xi, Xuemei

AU - Chan, Mansun

AU - Hu, Chenming

PY - 2010/10

Y1 - 2010/10

UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000283456100011

UR - https://openalex.org/W1993062369

UR - https://www.scopus.com/pages/publications/77957166421

U2 - 10.1016/j.mejo.2010.09.001

DO - 10.1016/j.mejo.2010.09.001

M3 - Comment/debate

SN - 0026-2692

VL - 41

SP - 693

JO - Microelectronics Journal

JF - Microelectronics Journal

IS - 10

ER -

Erratum: Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))

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