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Erratum: Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))

  • Jin He*
  • , Zhang Xing
  • , Yangyuan Wang
  • , Xuemei Xi
  • , Mansun Chan
  • , Chenming Hu
  • *Corresponding author for this work

Research output: Contribution to journalComment/debate

Original languageEnglish
Pages (from-to)693
Number of pages1
JournalMicroelectronics Journal
Volume41
Issue number10
DOIs
Publication statusPublished - Oct 2010
Externally publishedYes

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