Fast and adaptive reliability analysis via kriging and partial least squares

Lavi R. Zuhal*, Ghifari Adam Faza, Pramudita Satria Palar, Rhea Patricia Liem

*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

4 Citations (Scopus)

Abstract

This paper studies a framework for reliability analysis using Kriging with active learning and a dimensionality reduction technique based on partial least squares. The use of Kriging with partial least squares (KPLS) aims to accelerate the active learning process of computing the failure probability, which can be expensive due to the requirement to build several Kriging models as new samples are added. This speed-up is primarily achieved through the faster training time of the KPLS without any significant loss in the Kriging model’s accuracy. Experiments were performed on an analytical and heat-conduction problem with uncertain coefficients. Results show that KPLS with four principal components can significantly accelerate the computation of the failure probability while still yielding accurate values compared to the ordinary Kriging on high-dimensional problems. Moreover, in terms of the number of simulation calls, KPLS is also faster than the ordinary Kriging on the analytical problem. The result signifies that KPLS offers faster convergence in terms of overall time and the number of simulations.

Original languageEnglish
Title of host publicationAIAA Scitech 2021 Forum
PublisherAmerican Institute of Aeronautics and Astronautics Inc, AIAA
Pages1-11
Number of pages11
ISBN (Print)9781624106095
DOIs
Publication statusPublished - 2021
Externally publishedYes
EventAIAA Science and Technology Forum and Exposition, AIAA SciTech Forum 2021 - Virtual, Online
Duration: 11 Jan 202115 Jan 2021

Publication series

NameAIAA Scitech 2021 Forum

Conference

ConferenceAIAA Science and Technology Forum and Exposition, AIAA SciTech Forum 2021
CityVirtual, Online
Period11/01/2115/01/21

Bibliographical note

Publisher Copyright:
© 2021, American Institute of Aeronautics and Astronautics Inc, AIAA. All rights reserved.

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