Abstract
Immersion Ag and immersion Sn coatings obtained through the electroless process have emerged as an alternative to Ni/Au metallisation layers for more uniform thickness and lower material cost. Microscopic studies by SEM, AFM and TEM indicated that the Ag coating had a finer surface morphology and lower thickness than the Sn coating. Composition study by XPS indicated that copper and sulphur were present in the Ag coating surface, indicating migration of the underlying copper layer and tarnishing of the silver surface. Further study based on the D-SIM revealed that both the Ag and Sn immersion coatings were organometallic in nature. Wire bond mechanical tests showed that both the Al and Au wires were bondable on immersion Ag finish. However, the bondability of these two wires on immersion Sn was poor due likely to the low melting point of the Sn intermetallic. Further study is required to verify whether grain size and hardness of Sn finish would affect wire bondability. Plasma treatment and UV/ozone treatment were applied to these plates with no appreciable improvement in bondability. Fracture analysis of the bonded Ag coating indicated that the wire broke at the neck after pull test, a reflection of lower wire strength at the necked region than at the bonded interface, as also confirmed by the lower pull strength than the shear strength.
| Original language | English |
|---|---|
| Title of host publication | Advances in Electronic Materials and Packaging 2001 |
| Editors | S.B. Lee, K.W. Paik |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 56-62 |
| Number of pages | 7 |
| ISBN (Electronic) | 0780371577, 9780780371576 |
| DOIs | |
| Publication status | Published - 2001 |
| Event | 3rd International Symposium on Electronic Materials and Packaging, EMAP 2001 - Jeju Island, Korea, Republic of Duration: 19 Nov 2001 → 22 Nov 2001 |
Publication series
| Name | Advances in Electronic Materials and Packaging 2001 |
|---|
Conference
| Conference | 3rd International Symposium on Electronic Materials and Packaging, EMAP 2001 |
|---|---|
| Country/Territory | Korea, Republic of |
| City | Jeju Island |
| Period | 19/11/01 → 22/11/01 |
Bibliographical note
Publisher Copyright:© 2001 IEEE.
Fingerprint
Dive into the research topics of 'Feasibility and characterization study of Al and Au wire bonding on immersion Ag and Sn coatings'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver