GaN Buffer Traps in GaN-on-Si Structure Studied by Thermally Stimulated Current and Back-gating Measurements

Sen Huang, Baoling Huang, Jianbiao Lu, Chunhua Zhou, Kevin Jing Chen

Research output: Contribution to conference › Conference Paper

Original language	English
Publication status	Published - 2013
Event	10th Int. Conf. on Nitride Semiconductors (ICNS-10) - Duration: 1 Jan 2013 → 1 Jan 2013

Conference	10th Int. Conf. on Nitride Semiconductors (ICNS-10)
Period	1/01/13 → 1/01/13

Access to Document

@conference{18c59e48c1f1466cbddfd27d5570aa09,

title = "GaN Buffer Traps in GaN-on-Si Structure Studied by Thermally Stimulated Current and Back-gating Measurements",

author = "Sen Huang and Baoling Huang and Jianbiao Lu and Chunhua Zhou and Chen, \{Kevin Jing\}",

year = "2013",

language = "English",

note = "10th Int. Conf. on Nitride Semiconductors (ICNS-10) ; Conference date: 01-01-2013 Through 01-01-2013",

}