| Original language | English |
|---|---|
| IPC | H04L 1/00 |
| Priority date | 22/11/23 |
| Filing date | 20/11/24 |
| Publication status | Published - 30 May 2025 |
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GENERATING TEST ERROR PATTERNS (TEPS) FOR SOFT-INPUT STEP-GRAND
Syed Mohsin ABBAS (Key Inventor), Chi Ying TSUI (Key Inventor)
Research output: Patent