Hetero-epitaxy of III-V compounds lattice-matched to InP by MOCVD for device applications

Chak Wah Tang, Haiou Li, Zhenyu Zhong, Kai Lun Ng, Kei May Lau

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

4 Citations (Scopus)

Abstract

Device quality Al0.49In0.51As/Ga 0.47In0.53As MHEMT structures have been grown by MOCVD on GaAs substrates, with 2-DEG mobility over 8700 cm2/V-s and sheet carrier density at around 4 × 1012 cm-2. A 150 nm T-gate transistor demonstrated unity current gain cutoff frequency (f T) and maximum oscillation frequency (fmax) of 279 and 231 GHz, respectively.

Original languageEnglish
Title of host publicationIEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009
Pages136-139
Number of pages4
DOIs
Publication statusPublished - 2009
EventIEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009 - Newport Beach, CA, United States
Duration: 10 May 200914 May 2009

Publication series

NameConference Proceedings - International Conference on Indium Phosphide and Related Materials
ISSN (Print)1092-8669

Conference

ConferenceIEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009
Country/TerritoryUnited States
CityNewport Beach, CA
Period10/05/0914/05/09

Keywords

  • AlInAs/GaInAs
  • LT buffer
  • MHEMTs
  • MOCVD
  • Metamorphic HEMT

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