@inproceedings{e4f4f0a1aee4416eaf19295b17039b1e,
title = "Hetero-epitaxy of III-V compounds lattice-matched to InP by MOCVD for device applications",
abstract = "Device quality Al0.49In0.51As/Ga 0.47In0.53As MHEMT structures have been grown by MOCVD on GaAs substrates, with 2-DEG mobility over 8700 cm2/V-s and sheet carrier density at around 4 × 1012 cm-2. A 150 nm T-gate transistor demonstrated unity current gain cutoff frequency (f T) and maximum oscillation frequency (fmax) of 279 and 231 GHz, respectively.",
keywords = "AlInAs/GaInAs, LT buffer, MHEMTs, MOCVD, Metamorphic HEMT",
author = "Tang, \{Chak Wah\} and Haiou Li and Zhenyu Zhong and Ng, \{Kai Lun\} and Lau, \{Kei May\}",
year = "2009",
doi = "10.1109/ICIPRM.2009.5012460",
language = "English",
isbn = "9781424434336",
series = "Conference Proceedings - International Conference on Indium Phosphide and Related Materials",
pages = "136--139",
booktitle = "IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009",
note = "IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009 ; Conference date: 10-05-2009 Through 14-05-2009",
}