Abstract
Distortion in double-diffused MOS transistors (DMOS) at high frequencies is considered in this paper. A high-frequency model, including nonlinearities, is developed for lateral double-diffused transistors (LDMOS). A complete distortion analysis, based on this model and using the Volterra Series approach, is then presented. Analytical expressions for second- and third-order intermodulation distortions are also obtained. Good agreement between first-order theory and experiment is obtained.
| Original language | English |
|---|---|
| Pages (from-to) | 1223-1233 |
| Number of pages | 11 |
| Journal | Solid-State Electronics |
| Volume | 28 |
| Issue number | 12 |
| Publication status | Published - Dec 1985 |
| Externally published | Yes |