High frequency distortion analysis of DMOS transistors

J. K.O. Sin*, C. A.T. Salama

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

2 Citations (Scopus)

Abstract

Distortion in double-diffused MOS transistors (DMOS) at high frequencies is considered in this paper. A high-frequency model, including nonlinearities, is developed for lateral double-diffused transistors (LDMOS). A complete distortion analysis, based on this model and using the Volterra Series approach, is then presented. Analytical expressions for second- and third-order intermodulation distortions are also obtained. Good agreement between first-order theory and experiment is obtained.

Original languageEnglish
Pages (from-to)1223-1233
Number of pages11
JournalSolid-State Electronics
Volume28
Issue number12
Publication statusPublished - Dec 1985
Externally publishedYes

Fingerprint

Dive into the research topics of 'High frequency distortion analysis of DMOS transistors'. Together they form a unique fingerprint.

Cite this