TY - JOUR
T1 - How to measure and interpret the conduction current in a.c. thin-film electroluminescent devices
AU - Neyts, K. A.
AU - De Visschere, P.
PY - 1992/7
Y1 - 1992/7
N2 - In this paper we derive a general formula for the current supplied to a thin-film electroluminescent device, with a variable applied voltage and moving charges in the semiconductor layer. This formula results in an equivalent electrical network, with a current source representing the average current in the phosphor layer. We show how this current can be measured accurately by using a bridge measurement technique.
AB - In this paper we derive a general formula for the current supplied to a thin-film electroluminescent device, with a variable applied voltage and moving charges in the semiconductor layer. This formula results in an equivalent electrical network, with a current source representing the average current in the phosphor layer. We show how this current can be measured accurately by using a bridge measurement technique.
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:A1992JB92400008
UR - https://openalex.org/W2008426352
UR - https://www.scopus.com/pages/publications/0026897862
U2 - 10.1016/0038-1101(92)90321-3
DO - 10.1016/0038-1101(92)90321-3
M3 - Journal Article
SN - 0038-1101
VL - 35
SP - 933
EP - 936
JO - Solid-State Electronics
JF - Solid-State Electronics
IS - 7
ER -