Abstract
Metalorganic chemical vapor deposition (MOCVD) growth of InP-based quantum cascade laser (QCL) structures on a Si (001) substrate is demonstrated by employing a metamorphic InP buffer layer with InAs/InP quantum dots as dislocation filters. Calibration samples consist of a strain-compensated 11.98 nm In0.365Al0.635As/14.8 nm In0.64Ga0.36As superlattice (SL) structure as well as 5-stages of the λ ≈ 4.8 µm QCL active region, which are grown atop the metamorphic buffer and are used to assess the structural properties of the SL through high-resolution X-ray diffraction and high-resolution transmission electron microscopy. Full QCL structures with 40-stage active region are fabricated into edge-emitting ridge-waveguide structures and demonstrate low temperature electroluminescence with a FWHM of 48.6 meV.
| Original language | English |
|---|---|
| Article number | 1800493 |
| Journal | Physica Status Solidi (A) Applications and Materials Science |
| Volume | 216 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 9 Jan 2019 |
Bibliographical note
Publisher Copyright:© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Keywords
- metalorganic chemical vapor deposition
- metamorphic buffer layers
- quantum cascade lasers
- semiconducting III–V materials
- superlattice
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