III–V Superlattices on InP/Si Metamorphic Buffer Layers for λ≈4.8 μm Quantum Cascade Lasers

Ayushi Rajeev, Bei Shi, Qiang Li, Jeremy D. Kirch, Micah Cheng, Aaron Tan, Honghyuk Kim, Kevin Oresick, Chris Sigler, Kei M. Lau, Thomas F. Kuech, Luke J. Mawst*

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

Abstract

Metalorganic chemical vapor deposition (MOCVD) growth of InP-based quantum cascade laser (QCL) structures on a Si (001) substrate is demonstrated by employing a metamorphic InP buffer layer with InAs/InP quantum dots as dislocation filters. Calibration samples consist of a strain-compensated 11.98 nm In0.365Al0.635As/14.8 nm In0.64Ga0.36As superlattice (SL) structure as well as 5-stages of the λ ≈ 4.8 µm QCL active region, which are grown atop the metamorphic buffer and are used to assess the structural properties of the SL through high-resolution X-ray diffraction and high-resolution transmission electron microscopy. Full QCL structures with 40-stage active region are fabricated into edge-emitting ridge-waveguide structures and demonstrate low temperature electroluminescence with a FWHM of 48.6 meV.

Original languageEnglish
Article number1800493
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume216
Issue number1
DOIs
Publication statusPublished - 9 Jan 2019

Bibliographical note

Publisher Copyright:
© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Keywords

  • metalorganic chemical vapor deposition
  • metamorphic buffer layers
  • quantum cascade lasers
  • semiconducting III–V materials
  • superlattice

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