Improve chip pin performance using optical interconnects

Zhehui Wang, Jiang Xu, Peng Yang, Xuan Wang, Zhe Wang, Luan Huu Kinh Duong, Zhifei Wang, Rafael Kioji Vivas Maeda, Haoran Li

Research output: Contribution to journalJournal Articlepeer-review

Abstract

With the fast development of processor chips, power-efficient, high-bandwidth, and low-latency interchip interconnects become more and more important. Studies show that the bandwidth of traditional parallel interconnects with low I/O clock frequencies will become bottlenecks in the near future. To solve this problem, two types of high-bandwidth interchip interconnects are developed. Low-swing differential electrical interconnects have widely been used in high-speed I/O designs. On the other hand, optical interconnects promise high bandwidth, low latency, and could improve the chip pin performance for manycore processors. They are becoming potential alternatives for electrical interconnects. This paper systematically models these two types of interconnects in terms of crosstalk noises, attenuation, and receiver sensitivities. Based on the proposed models, we developed optical and electrical interfaces and links (OEIL) and an analysis tool for OEIL. The OEIL can be used to analyze the energy consumption, bandwidth density, and latency of interconnects. Analytical models are verified by the results of published experiments. It shows that the optical interconnects have much higher bandwidth densities than the electrical interconnects. With this feature, the optical interconnects can significantly reduce I/O pin count compared with the electrical interconnects. For example, they can save at least 92% signal pins when connecting chips more than 25 cm (10 in) apart. The energy consumption of optical interconnects is comparable with that of electrical interconnects, and the latency of polymer waveguide-based optical interconnects is 18% less than that of electrical interconnect.

Original languageEnglish
Article number7154512
Pages (from-to)1574-1587
Number of pages14
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume24
Issue number4
DOIs
Publication statusPublished - Apr 2016

Bibliographical note

Publisher Copyright:
© 1993-2012 IEEE.

Keywords

  • Interconnect
  • modeling
  • performance.

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