In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

Yang Lu^*, Yajing Shen, Xinyu Liu, Mohd Ridzuan Bin Ahmad, Yan Chen

^*Corresponding author for this work

Research output: Contribution to journal › Editorial

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@article{68208a4490e04933b85284eae72049fb,

title = "In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization",

author = "Yang Lu and Yajing Shen and Xinyu Liu and Ahmad, \{Mohd Ridzuan Bin\} and Yan Chen",

year = "2017",

doi = "10.1155/2017/8016571",

language = "English",

volume = "2017",

journal = "Scanning",

issn = "0161-0457",

publisher = "John Wiley and Sons Inc",

}

TY - JOUR

T1 - In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

AU - Lu, Yang

AU - Shen, Yajing

AU - Liu, Xinyu

AU - Ahmad, Mohd Ridzuan Bin

AU - Chen, Yan

PY - 2017

Y1 - 2017

UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000414730100001

UR - https://openalex.org/W2766277786

UR - https://www.scopus.com/pages/publications/85042430407

U2 - 10.1155/2017/8016571

DO - 10.1155/2017/8016571

M3 - Editorial

C2 - 29238439

SN - 0161-0457

VL - 2017

JO - Scanning

JF - Scanning

M1 - 8016571

ER -