Infrared reflectivity of Cox(SiO2)1-x (x∼0.85, 0.55, 0.38) granular films on SiO2 glass substrates

Néstor E. Massa; Juliano C. Denardin; Leandro M. Socolovsky; Marcelo Knobel; Fernando Pablo de la Cruz; Xixiang Zhang

doi:10.1016/j.ssc.2006.12.019

Infrared reflectivity of Co_x(SiO₂)_1-x (x∼0.85, 0.55, 0.38) granular films on SiO₂ glass substrates

Néstor E. Massa^*
, Juliano C. Denardin
, Leandro M. Socolovsky
, Marcelo Knobel
, Fernando Pablo de la Cruz
, Xixiang Zhang

^*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

2 Citations (Scopus)

Abstract

We report the infrared specular reflectivity of Co_x(SiO₂)_1-x (x ∼ 0.85, 0.55, 0.38) films on SiO₂ glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.

Original language	English
Pages (from-to)	551-554
Number of pages	4
Journal	Solid State Communications
Volume	141
Issue number	10
DOIs	https://doi.org/10.1016/j.ssc.2006.12.019
Publication status	Published - Mar 2007
Externally published	Yes

Keywords

A. Granular films
D. Electron-phonon interactions
D. Optical properties
E. Light absorption and reflection

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10.1016/j.ssc.2006.12.019

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title = "Infrared reflectivity of Cox(SiO2)1-x (x∼0.85, 0.55, 0.38) granular films on SiO2 glass substrates",

abstract = "We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.",

keywords = "A. Granular films, D. Electron-phonon interactions, D. Optical properties, E. Light absorption and reflection",

author = "Massa, \{N{\'e}stor E.\} and Denardin, \{Juliano C.\} and Socolovsky, \{Leandro M.\} and Marcelo Knobel and \{de la Cruz\}, \{Fernando Pablo\} and Xixiang Zhang",

year = "2007",

month = mar,

doi = "10.1016/j.ssc.2006.12.019",

language = "English",

volume = "141",

pages = "551--554",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Ltd",

number = "10",

}

TY - JOUR

T1 - Infrared reflectivity of Cox(SiO2)1-x (x∼0.85, 0.55, 0.38) granular films on SiO2 glass substrates

AU - Massa, Néstor E.

AU - Denardin, Juliano C.

AU - Socolovsky, Leandro M.

AU - Knobel, Marcelo

AU - de la Cruz, Fernando Pablo

AU - Zhang, Xixiang

PY - 2007/3

Y1 - 2007/3

N2 - We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.

AB - We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.

KW - A. Granular films

KW - D. Electron-phonon interactions

KW - D. Optical properties

KW - E. Light absorption and reflection

UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000244737500005

UR - https://openalex.org/W2049482387

U2 - 10.1016/j.ssc.2006.12.019

DO - 10.1016/j.ssc.2006.12.019

M3 - Journal Article

SN - 0038-1098

VL - 141

SP - 551

EP - 554

JO - Solid State Communications

JF - Solid State Communications

IS - 10

ER -

Infrared reflectivity of Co_x(SiO₂)_1-x (x∼0.85, 0.55, 0.38) granular films on SiO₂ glass substrates

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Keywords

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