| Original language | English |
|---|---|
| Pages | 91 |
| Number of pages | 1 |
| DOIs | |
| Publication status | Published - 2010 |
| Externally published | Yes |
| Event | 28th IEEE VLSI Test Symposium, VTS10 - Santa Cruz, CA, United States Duration: 19 Apr 2010 → 22 Apr 2010 |
Conference
| Conference | 28th IEEE VLSI Test Symposium, VTS10 |
|---|---|
| Country/Territory | United States |
| City | Santa Cruz, CA |
| Period | 19/04/10 → 22/04/10 |