TY - JOUR
T1 - Integrated design of run-to-run PID controller and SPC monitoring for process disturbance rejection
AU - Tsung, Fugee
AU - Shi, Jianjun
PY - 1999
Y1 - 1999
N2 - An integrated design methodology has been developed for a run-to-run PID controller and SPC monitoring for the purpose of process disturbance rejection. In the paper, the process disturbance is assumed to be an ARMA (1,1) process. A detailed procedure is developed to design a PID controller which minimizes process variability. The performance of the PID controller is also discussed. A joint monitoring of input and output, using Bonferroni's approach, is then designed for the controlled process. The ARL performance is studied. One major contribution of the paper is to develop a complete procedure and design plots, which serve as tools to conduct all the aforementioned tasks. An example is provided to illustrate the integrated design approach.
AB - An integrated design methodology has been developed for a run-to-run PID controller and SPC monitoring for the purpose of process disturbance rejection. In the paper, the process disturbance is assumed to be an ARMA (1,1) process. A detailed procedure is developed to design a PID controller which minimizes process variability. The performance of the PID controller is also discussed. A joint monitoring of input and output, using Bonferroni's approach, is then designed for the controlled process. The ARL performance is studied. One major contribution of the paper is to develop a complete procedure and design plots, which serve as tools to conduct all the aforementioned tasks. An example is provided to illustrate the integrated design approach.
UR - https://openalex.org/W2170204123
UR - https://www.scopus.com/pages/publications/0032683885
U2 - 10.1023/A:1007698222427
DO - 10.1023/A:1007698222427
M3 - Journal Article
SN - 0740-817X
VL - 31
SP - 517
EP - 527
JO - IIE Transactions (Institute of Industrial Engineers)
JF - IIE Transactions (Institute of Industrial Engineers)
IS - 6
ER -