TY - JOUR
T1 - Low energy multi-stage level converter for sub-threshold logic
AU - Shao, H.
AU - Li, X.
AU - Tsui, C. Y.
PY - 2011/9
Y1 - 2011/9
N2 - Robustness is the main concern in the design of level converters (LCs) for sub-threshold voltage applications. Besides this, when a sub-threshold voltage is applied to the input of the LC, the output transition time of the LC is very long and the short-circuit current through the logic gates that are driven by the LC output is large. The circuit's total energy consumption increases. In this study, a novel single-stage LC that can operate robustly for sub-threshold signal is firstly presented. Based on the single-stage LC circuit, a multi-stage sub-threshold LC structure is proposed, which features similar operation robustness, and at the same time, greatly reduces the output transition time of the LC. As a result, the circuit's total energy consumption (including that of the fanout logic gates) is significantly reduced. Extensive simulations were carried out to demonstrate the operation robustness of the authors proposed multi-stage sub-threshold LC. Measurements were done on a fabricated test chip to verify the operation and demonstrate the performance improvement of the design.
AB - Robustness is the main concern in the design of level converters (LCs) for sub-threshold voltage applications. Besides this, when a sub-threshold voltage is applied to the input of the LC, the output transition time of the LC is very long and the short-circuit current through the logic gates that are driven by the LC output is large. The circuit's total energy consumption increases. In this study, a novel single-stage LC that can operate robustly for sub-threshold signal is firstly presented. Based on the single-stage LC circuit, a multi-stage sub-threshold LC structure is proposed, which features similar operation robustness, and at the same time, greatly reduces the output transition time of the LC. As a result, the circuit's total energy consumption (including that of the fanout logic gates) is significantly reduced. Extensive simulations were carried out to demonstrate the operation robustness of the authors proposed multi-stage sub-threshold LC. Measurements were done on a fabricated test chip to verify the operation and demonstrate the performance improvement of the design.
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000294710000003
UR - https://openalex.org/W2026239320
UR - https://www.scopus.com/pages/publications/82355164567
U2 - 10.1049/iet-cdt.2009.0065
DO - 10.1049/iet-cdt.2009.0065
M3 - Journal Article
SN - 1751-8601
VL - 5
SP - 375
EP - 385
JO - IET Computers and Digital Techniques
JF - IET Computers and Digital Techniques
IS - 5
ER -