Abstract
In this paper, we report a method to measure the viscoelastic properties, namely the plateau shear modulus and zero-shear viscosity, of nanometer polymer films. In this method, atomic force microscopy (AFM) is used to capture the surface topographic image of the films at different times as they are annealed at the measurement temperature. A model is developed based on the dynamics of surface capillary waves to analyze the data. We demonstrate how this method was applied to measure the viscoelastic properties of polystyrene films supported by silicon with thicknesses of 3 and 125 nm.
| Original language | English |
|---|---|
| Pages (from-to) | 7460-7464 |
| Number of pages | 5 |
| Journal | Macromolecules |
| Volume | 44 |
| Issue number | 18 |
| DOIs | |
| Publication status | Published - 27 Sept 2011 |
| Externally published | Yes |