Modeling of internal transparent collector IGBTs and the extraction of electron lifetime in nano-voids layer

D. Q. Hu, Y. Wu, B. W. Kang, Y. P. Jia, Johnny K.O. Sin

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

Abstract

A new type of insulated gate bipolar transistor (IGBT) - internal transparent collector (ITC) IGBT is proposed. It is quite similar to that of the PT-IGBT, but a very low carrier lifetime control region is introduced in the P+ substrate near the p-collector/n-buffer junction. Based on quasi-static hypothesis, the ITC-IGBTs' static characteristic equations are given. The turn-off equations are also derived on base of non-quasi-static analysis. The model is used to our fabricated device structure and the results fit well to the experiment results. Based on the relationship of Von and local carrier lifetime, electron lifetime in carrier lifetime control region is deduced. They are at range of 0.2-30 nanoseconds. The static performance as well as turn-off loses of ITC-IGBT is compared to PT- and FS-IGBT. The ITC-IGBT shows good potential for 600V IGBT applications.

Original languageEnglish
Title of host publication2009 IEEE Energy Conversion Congress and Exposition, ECCE 2009
Pages3948-3953
Number of pages6
DOIs
Publication statusPublished - 2009
Event2009 IEEE Energy Conversion Congress and Exposition, ECCE 2009 - San Jose, CA, United States
Duration: 20 Sept 200924 Sept 2009

Publication series

Name2009 IEEE Energy Conversion Congress and Exposition, ECCE 2009

Conference

Conference2009 IEEE Energy Conversion Congress and Exposition, ECCE 2009
Country/TerritoryUnited States
CitySan Jose, CA
Period20/09/0924/09/09

Keywords

  • IGBT
  • Transparent collector

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