Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy

Saeed Shamshiri; Kwang Ting Cheng

doi:10.1109/VTS.2010.5469579

Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy

Saeed Shamshiri^*
, Kwang Ting Cheng

^*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

8 Citations (Scopus)

Abstract

In this paper, we propose a quality metric for an NoC and model the yield and cost of a spare-enhanced multicore chip subject to a given quality constraint. Our experiments show that the overall quality of a mesh-based NoC depends more on the reliability of the inner links than the outer links; therefore, a non-uniform distribution of spare wires could be more effective and cost efficient than a uniform approach.

Original language	English
Title of host publication	Proceedings - 28th IEEE VLSI Test Symposium, VTS10
Pages	194-199
Number of pages	6
DOIs	https://doi.org/10.1109/VTS.2010.5469579
Publication status	Published - 2010
Externally published	Yes
Event	28th IEEE VLSI Test Symposium, VTS10 - Santa Cruz, CA, United States Duration: 19 Apr 2010 → 22 Apr 2010

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium

Conference

Conference	28th IEEE VLSI Test Symposium, VTS10
Country/Territory	United States
City	Santa Cruz, CA
Period	19/04/10 → 22/04/10

Keywords

NoC
Non-uniform spare distributtion
Quality analysis
SoC
Yield and cost modeling

Access to Document

10.1109/VTS.2010.5469579

Cite this

@inproceedings{09110306dce9442fab9ad70a9c813a2c,

title = "Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy",

abstract = "In this paper, we propose a quality metric for an NoC and model the yield and cost of a spare-enhanced multicore chip subject to a given quality constraint. Our experiments show that the overall quality of a mesh-based NoC depends more on the reliability of the inner links than the outer links; therefore, a non-uniform distribution of spare wires could be more effective and cost efficient than a uniform approach.",

keywords = "NoC, Non-uniform spare distributtion, Quality analysis, SoC, Yield and cost modeling",

author = "Saeed Shamshiri and Cheng, \{Kwang Ting\}",

year = "2010",

doi = "10.1109/VTS.2010.5469579",

language = "English",

isbn = "9781424466481",

series = "Proceedings of the IEEE VLSI Test Symposium",

pages = "194--199",

booktitle = "Proceedings - 28th IEEE VLSI Test Symposium, VTS10",

note = "28th IEEE VLSI Test Symposium, VTS10 ; Conference date: 19-04-2010 Through 22-04-2010",

}

Shamshiri, S & Cheng, KT 2010, Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy. in Proceedings - 28th IEEE VLSI Test Symposium, VTS10., 5469579, Proceedings of the IEEE VLSI Test Symposium, pp. 194-199, 28th IEEE VLSI Test Symposium, VTS10, Santa Cruz, CA, United States, 19/04/10. https://doi.org/10.1109/VTS.2010.5469579

Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy. / Shamshiri, Saeed; Cheng, Kwang Ting.
Proceedings - 28th IEEE VLSI Test Symposium, VTS10. 2010. p. 194-199 5469579 (Proceedings of the IEEE VLSI Test Symposium).

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

TY - GEN

T1 - Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy

AU - Shamshiri, Saeed

AU - Cheng, Kwang Ting

PY - 2010

Y1 - 2010

N2 - In this paper, we propose a quality metric for an NoC and model the yield and cost of a spare-enhanced multicore chip subject to a given quality constraint. Our experiments show that the overall quality of a mesh-based NoC depends more on the reliability of the inner links than the outer links; therefore, a non-uniform distribution of spare wires could be more effective and cost efficient than a uniform approach.

AB - In this paper, we propose a quality metric for an NoC and model the yield and cost of a spare-enhanced multicore chip subject to a given quality constraint. Our experiments show that the overall quality of a mesh-based NoC depends more on the reliability of the inner links than the outer links; therefore, a non-uniform distribution of spare wires could be more effective and cost efficient than a uniform approach.

KW - NoC

KW - Non-uniform spare distributtion

KW - Quality analysis

KW - SoC

KW - Yield and cost modeling

UR - https://openalex.org/W2137476061

U2 - 10.1109/VTS.2010.5469579

DO - 10.1109/VTS.2010.5469579

M3 - Conference Paper published in a book

SN - 9781424466481

T3 - Proceedings of the IEEE VLSI Test Symposium

SP - 194

EP - 199

BT - Proceedings - 28th IEEE VLSI Test Symposium, VTS10

T2 - 28th IEEE VLSI Test Symposium, VTS10

Y2 - 19 April 2010 through 22 April 2010

ER -

Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this