Abstract
A multi-bits/cell double gate oxide-nitride-oxide nonvolatile memory is proposed and demonstrated by numerical device simulation. The operational mechanisms including read, program, erase and inhibit in an array structure are studied in detail. This multi-bits storage capability per single cell is very suitable for high density NVM application. With a slight modification, the proposed structure can achieve double program/read rate by programming/reading 2 bits of the memory cell simultaneously.
| Original language | English |
|---|---|
| Pages | 691-694 |
| Number of pages | 4 |
| Publication status | Published - 2004 |
| Event | 2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT 2004 - Beijing, China Duration: 18 Oct 2004 → 21 Oct 2004 |
Conference
| Conference | 2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT 2004 |
|---|---|
| Country/Territory | China |
| City | Beijing |
| Period | 18/10/04 → 21/10/04 |
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