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Multi-bit MONOS nonvolatile memory based on double-gate technology

  • Alain Chun*
  • , Keung Chan
  • , Kam Hung Yuen
  • , Tsz Yin Man
  • , Mansun Chan
  • *Corresponding author for this work

Research output: Contribution to conferenceConference Paperpeer-review

Abstract

A multi-bits/cell double gate oxide-nitride-oxide nonvolatile memory is proposed and demonstrated by numerical device simulation. The operational mechanisms including read, program, erase and inhibit in an array structure are studied in detail. This multi-bits storage capability per single cell is very suitable for high density NVM application. With a slight modification, the proposed structure can achieve double program/read rate by programming/reading 2 bits of the memory cell simultaneously.

Original languageEnglish
Pages691-694
Number of pages4
Publication statusPublished - 2004
Event2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT 2004 - Beijing, China
Duration: 18 Oct 200421 Oct 2004

Conference

Conference2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT 2004
Country/TerritoryChina
CityBeijing
Period18/10/0421/10/04

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