Abstract
This book presents an in-depth treatment of various power reduction and speed enhancement techniques based on multiple supply and threshold voltages. A detailed discussion of the sources of power consumption in CMOS circuits will be provided whilst focusing primarily on identifying the mechanisms by which sub-threshold and gate oxide leakage currents are generated. The authors present a comprehensive review of state-of-the-art dynamic, static supply and threshold voltage scaling techniques and discuss the pros and cons of supply and threshold voltage scaling techniques.
| Original language | English |
|---|---|
| Publisher | John Wiley and Sons |
| Number of pages | 225 |
| ISBN (Print) | 0470010231, 9780470010235 |
| DOIs | |
| Publication status | Published - 19 Oct 2006 |
| Externally published | Yes |